3GPPFDD_UE_TX

This section provides parameter information for Required Parameters, Basic Parameters, Signal Parameters, and parameters for the various measurements.

Description 3GPP FDD UE Tx test
Library WTB
Class TSDF3GPPFDD_UE_TX
Derived From baseWTB_TX

Parameters

Name	Description	Default	Sym	Unit	Type	Range
RequiredParameters
CE_TimeStep	Circuit envelope simulation time step	1/3.84 MHz/8		sec	real	(0, ∞)
WTB_TimeStep	Set CE_TimeStep < = 1/3.84e6/SamplesPerChip. SamplesPerChip is in Signal Parameters tab.
FSource	Source carrier frequency	1950 MHz		Hz	real	(0, ∞)
SourcePower	Source power	dbmtow(-20.0)		W	real	[0, ∞)
FMeasurement	Measurement carrier frequency	1950 MHz		Hz	real	(0, ∞)
MeasurementInfo	Available Measurements Each measurement has parameters on its tab/category below.
RF_EnvelopeMeasurement	Enable RF envelope measurement? NO, YES	YES			enum
PowerMeasurement	Enable power measurement? NO, YES	NO			enum
ACLR_Measurement	Enable ACLR measurement? NO, YES	NO			enum
ACLR_ST_Measurement	Enable ACLR switching transients measurement? NO, YES	NO			enum
OccupiedBW_Measurement	Enable occupied bandwidth measurement? NO, YES	NO			enum
CDP_Measurement	Enable code domain power measurement? NO, YES	NO			enum
PCDE_Measurement	Enable peak code domain error measurement? NO, YES	NO			enum
EVM_Measurement	Enable EVM measurement? NO, YES	NO			enum
BasicParameters
SourceR	Source resistance	50 Ohm		Ohm	real	(0, ∞)
SourceTemp	Source resistor temperature	-273.15		Celsius	real	[-273.15, ∞)
EnableSourceNoise	Enable source thermal noise? NO, YES	NO			enum
MeasR	Measurement resistance	50 Ohm		Ohm	real	[10, 1.0e6]
MirrorSourceSpectrum	Mirror source spectrum about carrier? NO, YES	NO			enum
MirrorMeasSpectrum	Mirror meas spectrum about carrier? NO, YES	NO			enum
RF_MirrorFreq	Mirror source frequency for spectrum/envelope measurement? NO, YES	NO			enum
MeasMirrorFreq	Mirror meas frequency for spectrum/envelope measurement? NO, YES	NO			enum
DUT_DelayBound	DUT delay bound	10.0 usec		sec	real	[0, (400.0/3840000)]
TestBenchSeed	Random number generator seed	1234567			int	[0, ∞)
SignalParameters
GainImbalance	Gain imbalance, Q vs I	0.0		dB	real	(-∞, ∞)
PhaseImbalance	Phase imbalance, Q vs I	0.0		deg	real	(-∞, ∞)
I_OriginOffset	I origin offset (percent)	0.0			real	(-∞, ∞)
Q_OriginOffset	Q origin offset (percent)	0.0			real	(-∞, ∞)
IQ_Rotation	IQ rotation	0.0		deg	real	(-∞, ∞)
SamplesPerChip	Samples per chip	8	S		int	[2, 32]
RRC_FilterLength	RRC filter length (chips)	16			int	[2, 128]
SpecVersion	Secification version: Version 03_00, Version 12_00, Version 03_02	Version 12_00			enum
SourceType	Source type: UL_12_2, UL_768	UL_12_2			enum
RF_EnvelopeMeasurementParameters
RF_EnvelopeDisplayPages	RF envelope measurement display pages: 3GPPFDD_UE_TX_Envelope Figures
RF_EnvelopeStart	RF envelope measurement start	0.0		sec	real	[0, ∞)
RF_EnvelopeStop	RF envelope measurement stop	(2560/3.84) usec		sec	real	(0, ∞)
RF_EnvelopeSlots	RF envelope measurement slots	1			int	[0, 100]
PowerMeasurementParameters
PowerDisplayPages	Power measurement display pages: 3GPPFDD_UE_TX_Power Equations 3GPPFDD_UE_TX_Power Table 3GPPFDD_UE_TX_Power Figures
PowerStartSlot	Start slot	0			int	[0, ∞)
PowerSlotsMeasured	Slots measured	1			int	[0, ∞)
ACLR_MeasurementParameters
ACLR_DisplayPages	ACLR measurement display pages: 3GPPFDD_UE_TX_ACLR Equations 3GPPFDD_UE_TX_ACLR Table 3GPPFDD_UE_TX_ACLR Figures
ACLR_Start	Measurement start	0.0		sec	real	[0, ∞)
ACLR_Stop	Measurement stop	(2560/3.84) usec		sec	real	(0, ∞)
ACLR_Slots	Measurement slots	0			int	[0, 100]
ACLR_SpecMeasResBW	Spectrum resolution bandwidth	0		Hz	real	[0, ∞)
ACLR_SpecMeasWindow	Window type: ACLR_none, ACLR_Hamming 0.54, ACLR_Hanning 0.50, ACLR_Gaussian 0.75, ACLR_Kaiser 7.865, ACLR_8510 6.0, ACLR_Blackman, ACLR_Blackman-Harris	ACLR_none			enum
ACLR_ST_MeasurementParameters
ACLR_ST_DisplayPages	ACLR ST measurement display pages: 3GPPFDD_UE_TX_ACLR_ST Table 3GPPFDD_UE_TX_ACLR_ST Equations
ACLR_ST_Start	Measurement start	0.0		sec	real	[0, ∞)
ACLR_ST_Stop	Measurement stop	(2560/3.84) usec		sec	real	(0, ∞)
ACLR_ST_Slots	Measurement slots	0			int	[0, 100]
OccupiedBW_MeasurementParameters
OBW_DisplayPages	Occupied BW measurement display pages: 3GPPFDD_UE_TX_OBW Equations 3GPPFDD_UE_TX_OBW Table 3GPPFDD_UE_TX_OBW Figures
OBW_Start	Measurement start	0.0		sec	real	[0, ∞)
OBW_Stop	Measurement stop	(2560/3.84) usec		sec	real	(0, ∞)
OBW_Slots	Measurement slots	0			int	[0, 100]
OBW_SpecMeasResBW	Spectrum resolution bandwidth	0		Hz	real	[0, ∞)
OBW_SpecMeasWindow	Window type: OBW_none, OBW_Hamming 0.54, OBW_Hanning 0.50, OBW_Gaussian 0.75, OBW_Kaiser 7.865, OBW_8510 6.0, OBW_Blackman, OBW_Blackman-Harris	OBW_none			enum
CDP_MeasurementParameters
CDP_DisplayPages	CDP measurement display pages:
CDP_StartSlot	Start slot	0			int	[0, ∞)
PCDE_MeasurementParameters
PCDE_DisplayPages	PCDE measurement display pages: 3GPPFDD_UE_TX_PCDE Equations 3GPPFDD_UE_TX_PCDE Table 3GPPFDD_UE_TX_PCDE Figures
PCDE_StartSlot	Start slot	0			int	[0, ∞)
EVM_MeasurementParameters
EVM_DisplayPages	EVM measurement display pages: 3GPPFDD_UE_TX_EVM Equations 3GPPFDD_UE_TX_EVM Table
EVM_Start	Measurement start	0.0		sec	real	[0, ∞)
EVM_SlotsMeasured	Slots to measure	1			int	[0, ∞)
SignalToESG_Parameters
EnableESG	Enable signal to ESG? NO, YES	NO			enum
ESG_Instrument	ESG instrument address	[GPIB0::19::INSTR][localhost][4790]			instrument
ESG_Start	Signal start	0.0		sec	real	[0, ∞)
ESG_Stop	Signal stop	(2560/3.84) usec		sec	real	[(ESG_Start+60/3.84e6/S), (ESG_Start+32/3.84/S)]
ESG_Slots	Slots to ESG	15			int	[0, 1000]
ESG_Power	ESG RF ouput power (dBm)	-20.0			real	(-∞, ∞)
ESG_ClkRef	Waveform clock reference: Internal, External	Internal			enum
ESG_ExtClkRefFreq	External clock reference freq	10 MHz		Hz	real	(0, ∞)
ESG_IQFilter	IQ filter: through, filter_2100kHz, filter_40MHz	through			enum
ESG_SampleClkRate	Sequencer sample clock rate	30.72 MHz		Hz	real	(0, ∞)
ESG_Filename	ESG waveform storage filename	3GPPFDD_UL			string
ESG_AutoScaling	Activate auto scaling? NO, YES	YES			enum
ESG_ArbOn	Select waveform and turn ArbOn after download? NO, YES	YES			enum
ESG_RFPowOn	Turn RF ON after download? NO, YES	YES			enum
ESG_EventMarkerType	Event marker type: Neither, Event1, Event2, Both	Event1			enum
ESG_MarkerLength	ESG marker length	10			int	[1, 60]

Pin Inputs

Pin	Name	Description	Signal Type
2	Meas_In	Test bench measurement RF input from RF circuit	timed

Pin Outputs

Pin	Name	Description	Signal Type
1	RF_Out	Test bench RF output to RF circuit	timed

Parameter Settings

More control of the test bench can be achieved by setting parameters on the Basic Parameters, Signal Parameters, and measurements categories for the activated measurements. Parameters for each category are described in the following sections.

Note For required parameter information, see Set the Required Parameters.

Basic Parameters

1. SourceR is the RF output source resistance.
2. SourceTemp is the RF output source resistance temperature (oC) and sets noise density in the RF output signal to (k(SourceTemp+273.15)) Watts/Hz, where k is Boltzmann's constant.
3. EnableSourceNoise, when set to NO disables the SourceTemp and effectively sets it to -273.15oC (0 Kelvin). When set to YES, the noise density due to SourceTemp is enabled.
4. MeasR defines the load resistance for the RF DUT output Meas signal into the test bench. This resistance loads the RF DUT output; it is also the reference resistance for Meas signal power measurements.
5. MirrorSourceSpectrum is used to invert the polarity of the Q envelope of the generated RF signal before it is sent to the RF DUT. Depending on the configuration and number of mixers in an RF transmitter, the signal at the input of the DUT may need to be mirrored. If such an RF signal is desired, set this parameter to YES.
6. MirrorMeasSpectrum is used to invert the polarity of the Q envelope in the Meas_in RF signal input to the test bench (and output from the RF DUT). Depending on the configuration and number of mixers in the RF DUT, the signal at its output may be mirrored compared to the signal generated by the signal source (before any mirroring is done because of the MirrorSourceSpectrum setting). Proper demodulation and measurement of the RF DUT output signal requires that its RF envelope is not mirrored compared to the signal generated by the signal source (before any mirroring is done because of the MirrorSourceSpectrum setting). If the Meas_in RF signal is mirrored, set this parameter to YES. Proper setting of this parameter is required for measurements on the Meas_in signal in TX test benches (EVM, Constellation, CDP, PCDE) and results in measurement on a signal with no spectrum mirroring.
7. TestBenchSeed is an integer used to seed the random number generator used with the test bench. This value is used by all test bench random number generators, except those RF DUT components that use their own specific seed parameter. TestBenchSeed initializes the random number generation. The same seed value produces the same random results, thereby giving you predictable simulation results. To generate repeatable random output from simulation to simulation, use any positive seed value. If you want the output to be truly random, enter the seed value of 0.
8. RF_MirrorFreq is used to invert the polarity of the Q envelope in the RF_out RF signal for RF envelope, ppectrum, ACLR, and occupied bandwidth measurements. RF_MirrorFreq is typically set by the user to NO when MirrorSourceSpectrum = NO; RF_MirrorFreq is typically set by the user to YES when MirrorSourceSpectrum = YES. Both settings result in viewing the RF_out signal with no spectrum mirroring. Other settings by the user result in RF_out signal for RF_Envelope and Spectrum measurements with spectrum mirroring.
9. MeasMirrorFreq is used to invert the polarity of the Q envelope in the Meas_in RF signal for the RF envelope, spectrum, ACLR, and occupied bandwidth measurements.
   MeasMirrorFreq is typically set to NO by the user when the combination of the MirrorSourceSpectrum value and any signal mirroring in the users RF DUT results in no spectrum mirroring in the Meas_in signal. MeasMirrorFreq is typically set to YES by the user when the combination of the MirrorSourceSpectrum and RF DUT results in spectrum mirroring in the Meas_in signal.
   Other settings result in Meas_in signal for RF_Envelope and Spectrum measurements with spectrum mirroring. The MirrorMeasSpectrum parameter setting has no impact on the setting or use of the MeasMirrorFreq parameter.
10. DUT_DelayBound is used to transfer the DUT delay for measurement synchronization. For measurements of RF_out before the DUT, RF delay bound is calculated by adding the delays caused by RRC filters in modulation and measurements. For measurements of the RF DUT output (Meas_in), the Meas delay bound is calculated by adding the DUT_DelayBound to the RF delay bound.

Signal Parameters

1. GainImbalance, PhaseImbalance, I_OriginOffset, Q_OriginOffset, and IQ_Rotation are used to add certain impairments to the ideal output RF signal. Impairments are added in the order described here.
   The unimpaired RF I and Q envelope voltages have gain and phase imbalance applied. The RF is given by:

   

   where A is a scaling factor that depends on the SourcePower and SourceR parameters specified by the user, V _I ( t ) is the in-phase RF envelope, V _Q ( t ) is the quadrature phase RF envelope, g is the gain imbalance

   

   and, Φ (in degrees) is the phase imbalance.
   Next, the signal V _RF ( t ) is rotated by IQ_Rotation degrees. The I_OriginOffset and Q_OriginOffset are then applied to the rotated signal. Note that the amounts specified are percentages with respect to the output rms voltage. The output rms voltage is given by sqrt(2 × SourceR × SourcePower).

2. SamplesPerChip is used to set the number of samples in a chip. The default value is set to 8 to display settings according to the 3GPP standard. It can be set to a larger value for a simulation frequency bandwidth wider than 8 × 3.84 MHz. It can be set to a smaller value for faster simulation times; however, this will result in lower signal fidelity. If SamplesPerChip = 8, the simulation RF bandwidth is larger than the signal bandwidth by a factor of 8 (e.g., simulation RF bandwidth = 8 × 3.84 MHz).
3. RRC_FilterLength is used to set root raised-cosine filter length in chips. The default value is set to 16 to transmit a 3GPP FDD uplink signal in time and frequency domains based on the 3GPP standard [4]. It can be set to a smaller value for faster simulation times; however, this will result in lower signal fidelity. Better Adjacent Channel Leakage Ratio (ACLR) can be obtained using a longer filter length. Increasing RRC_FilterLength to 24 or 32 should result in a better ACLR. This may also correlate better to ACLR measurements when using instruments from Agilent Technologies.
4. SpecVersion is used to specify the 3GPP specification versions 2000-03, 2000-12 or 2002-03.
5. SourceType is used to specify the type of baseband signal. Reference measurement channels 12.2 and 768 kbps as defined in [4] and [5] are available. Basic parameters of these channels are listed in the following tables.

   Uplink 12.2 kbps Reference Measurement Channel, Physical Parameters

   Parameter	Unit	Level
   Information bit rate	kbps	12.2
   DPDCH	kbps	60
   DPCCH	kbps	15
   DPCCH Slot Format		0
   DPCCH/DPDCH power ratio	dB	-5.46
   TFCI		On
   Repetition	%	23

   Uplink 12.2 kbps Reference Measurement Channel, Transport Channel Parameters

   Parameter	DTCH	DCCH
   Transport Channel Number	1	2
   Transport Block Size	244	100
   Transport Block Set Size	244	100
   Transmission Time Interval	20 ms	40 ms
   Type of Error Protection	Convolution Coding	Convolution Coding
   Coding Rate	1/3	1/3
   Rate Matching attribute	256	256
   Size of CRC	16	12

   Uplink 768 kbps Reference Measurement Channel, Physical Parameters

   Parameter	Unit	Level
   Information bit rate	kbps	2*384
   DPDCH1	kbps	960
   DPDCH2	kbps	960
   DPCCH	kbps	15
   DPCCH Slot Format		0
   DPCCH/DPDCH power ratio	dB	-11.48
   TFCI		On
   Puncturing	%	18

   Uplink 768 kbps Reference Measurement Channel, Transport Channel Parameters

   Parameter	DTCH	DCCH
   Transport Channel Number	1	2
   Transport Block Size	3840	100
   Transport Block Set Size	7680	100
   Transmission Time Interval	10 ms	40 ms
   Type of Error Protection	Turbo Coding	Convolution Coding
   Coding Rate	1/3	1/3
   Rate Matching attribute	256	256
   Size of CRC	16	12

RF Envelope Parameters

This measurement is not affected by the MirrorMeasSpectrum parameter. To apply spectrum mirroring to the measured RF_out signal, set RF_MirrorFreq = YES. To apply spectrum mirroring to the measured Meas_in signal, set MeasMirrorFreq = YES.

1. RF_EnvelopeDisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
2. RF_EnvelopeStart sets the start time for collecting input data.
3. RF_EnvelopeStop sets the stop time for collecting input data when RF_EnvelopeSlots = 0.
4. RF_EnvelopeSlots (when > 0) sets the number of slots over which data will be collected.

Depending on the values of RF_EnvelopeStart, RF_EnvelopeStop, and RF_EnvelopeSlots, the stop time may be adjusted.

For RF envelope measurement for both the RF_out and Meas_in signals:

Let:
Start = TimeStep * (int(RF_EnvelopeStart/TimeStep) + 0.5)
Stop = TimeStep * (int(RF_EnvelopeStop/TimeStep) + 0.5)

This means Start and Stop are forced to be an integer number of time-step intervals.

RF_EnvelopeSlots	Resultant Stop Time
0	Stop
> 0	Start + RF_EnvelopeSlots x SlotTime

For the RF envelope of Meas_in to contain at least one complete slot, the Stop value should be set to a minimum of SlotTime + (RF DUT time delay).

For information about TimeStep and SlotTime, see Test Bench Variables for Data Displays.

Power Measurement Parameters

1. PowerDisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
2. PowerStartSlot sets the number of slots which should be ignored.
3. PowerSlotsMeasured sets the number of slots over which data will be collected.

The measurement start time is PowerStartSlot × SlotTime. The measurement stop time is (PowerStartSlot+PowerSlotsMeasured) × SlotTime. SlotTime is defined in Test Bench Variables for Data Displays.

ACLR Measurement Parameters

The ACLR measurement is implemented by the spectrum measurement, which measures the RF signal spectrum in different frequency offsets. The ACLR can be calculated by analyzing the spectrum measurement in the data display file.

In the following, TimeStep denotes the simulation time step, and FMeasurement denotes the measured RF signal characterization frequency.

1. The measurement outputs the complex amplitude voltage values at the frequencies of the spectral tones. It does not output power at frequencies of the spectral tones. However, one can calculate and display the power spectrum as well as the magnitude and phase spectrum by using the dBm, mag, and phase functions of the data display window.
   Note that the dBm function assumes a 50-ohm reference resistance; if a different measurement was used in the test bench, its value can be specified as a second argument to the dBm function, for example, dBm(SpecMeas, Meas_RefR) where SpecMeas is the instance name of the spectrum measurement and Meas_RefR is the resistive load used.
   By default, the displayed spectrum extends from FMeasurement - 1/(2TimeStep) Hz to FMeasurement + 1/(2TimeStep) Hz. When FMeasurement < 1/(2TimeStep), the default spectrum extends to negative frequencies. The spectral content at these negative frequencies is conjugated, mirrored, and added to the spectral content of the closest positive frequency. This way, the negative frequency tones are displayed on the positive frequency axis as would happen in an RF spectrum analyzer measurement instrument. This process may introduce an error in the displayed frequency for the mirrored tones. The absolute error introduced is less than (spectrum frequency step) / 2 (see the following table for the definition of spectrum frequency step).
   The basis of the algorithm used by the spectrum measurement is the chirp-Z transform. The algorithm can use multiple slots and average the results to achieve video averaging (see note 6).
2. ACLR_DisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
3. ACLR_Start sets the start time for collecting input data.
4. ACLR_Stop sets the stop time for collecting input data when ACLR_Slots = 0 and ACLR_SpecMeasResBW = 0.
5. ACLR_Slots (when > 0) sets the number of slots over which data will be collected.
6. ACLR_SpecMeasResBW (when > 0) sets the resolution bandwidth of the spectrum measurement.
   Depending on the values of ACLR_Stop, ACLR_Slots, and ACLR_SpecMeasResBW, the stop time may be adjusted and/or spectrum video averaging may occur. The different cases are explained in the following table.
   Referring to the following table let:

   Start = TimeStep × int((ACLR_Start/TimeStep) + 0.5)
   Stop = TimeStep × int((ACLR_Stop/TimeStep) + 0.5)
   (This means Start and Stop are forced to be an integer number of time step intervals.)
   X be the Normalized Equivalent Noise BW of the window used

   Equivalent noise bandwidth (ENBW) compares the window to an ideal, rectangular filter. It is the equivalent width of a rectangular filter that passes the same amount of white noise as the window. The normalized ENBW is the ENBW multiplied by the time duration of the signal being windowed. See Window Options and Normalized Equivalent Noise Bandwidth for the normalized ENBW for the different window options available.
   The Start and Stop times are used for both the RF_out and Meas_in signal spectrum analyses. The Meas_in signal is delayed in time from the RF_out signal by the value of the RF DUT time delay. Thus for RF DUT time delay > 0, the RF_out and Meas_in signal are inherently different and some spectrum display difference in the two is expected.
   TimeStep and SlotTime are defined in Test Bench Variables for Data Displays.

   Effect of Different Values for ACLR_Stop, ACLR_Slots, and ACLR_SpecMeasResBW

   Case 1	ACLR_Slots = 0 ACLR_SpecMeasResBW = 0 Resultant stop time = Stop Resultant resolution BW = X/(Stop - Start) Resultant spectrum frequency step = 1/(Stop-Start) Video averaging status = None
   Case 2	ACLR_Slots > 0 ACLR_SpecMeasResBW = 0 Resultant stop time = Start + ACLR_Slots x SlotTime Notes: For ACLR_Slots > 0 and ACLR_SpecMeasResBW = 0 Video averaging occurs over all slot time intervals Resultant resolution BW = X/SlotTime Resultant spectrum frequency step = 1/SlotTime Video averaging status = Yes, when ACLR_Slots > 1
   Case 3	ACLR_Slots = 0 ACLR_SpecMeasResBW > 0 Resultant stop time = Start + N*SlotTimeInterval where N = int((Stop -Start)/SlotTimeInterval) + 1 For ACLR_Slots = 0 and ACLR_SpecMeasResBW > 0 Define SlotTimeInterval = TimeStep * int((X/(ACLR_SpecMeasResBW*TimeStep)) + 0.5) This means SlotTimeInterval is forced to a value that is an integer number of time step intervals. (Stop-Start) time is forced to be an integer number (N) of SlotTimeInterval N has a minimum value of 1 Video averaging occurs over all SlotTimeInterval The resolution bandwidth achieved is ResBW = X / SlotTimeInterval, which is very close to ACLR_SpecMeasResBW but may not be exactly the same if X/(ACLR_SpecMeasResBW*TimeStep) is not an exact integer. Resultant resolution BW = ResBW Resultant spectrum frequency step = ResBW Video averaging status = Yes when N > 1
   Case 4	ACLR_Slots > 0 ACLR_SpecMeasResBW > 0 Resultant stop time = Start + M*SlotTimeInterval where M = int((ACLR_Slots x SlotTime)/SlotTimeInterval) + 1 For ACLR_Slots > 0 and ACLR_SpecMeasResBW > 0 Define SlotTimeInterval = TimeStep * int((X/(ACLR_SpecMeasResBW*TimeStep)) + 0.5) This means SlotTimeInterval is forced to a value that is an integer number of time step intervals. (Stop-Start) time is forced to be an integer number (M) of the SlotTimeInterval M has a minimum value of 1 Video averaging occurs over all SlotTimeIntervals The resolution bandwidth achieved is ResBW = X / SlotTimeInterval, which is very close to ACLR_SpecMeasResBW but may not be exactly the same if X/(ACLR_SpecMeasResBW*TimeStep) is not an exact integer. Resultant resolution BW = ResBW Resultant spectrum frequency step = ResBW Video averaging status = Yes, when M > 1

7. ACLR_SpecMeasWindow specifies the window that will be applied to each slot before its spectrum is calculated. Different windows have different properties, affect the resolution bandwidth achieved, and affect spectral shape. Windowing is often necessary in transform-based (chirp-Z, FFT) spectrum estimation in order to reduce spectral distortion due to discontinuous or non-harmonic signal over the measurement time interval. Without windowing, the estimated spectrum may suffer from spectral leakage that can cause misleading measurements or masking of weak signal spectral detail by spurious artifacts.
   The windowing of a signal in time has the effect of changing its power. The spectrum measurement compensates for this and the spectrum is normalized so that the power contained in it is the same as the power of the input signal.
   Window Type Definitions:
   • none
     
     where N is the window size
   • Hamming 0.54
     
     where N is the window size
   • Hanning 0.50
     
     where N is the window size
     • Gaussian 0.75
       
       where N is the window size
     • Kaiser 7.865
       
       where N is the window size,  α = N / 2, and I ₀ (.) is the 0th order modified Bessel function of the first kind
     • 8510 6.0 (Kaiser 6.0)
       
       where N is the window size,  α = N / 2, and I ₀ (.) is the 0th order modified Bessel function of the first kind
     • Blackman
       
       where N is the window size
     • Blackman-Harris
       
       where N is the window size.

Window Options and Normalized Equivalent Noise Bandwidth

Window and Default Constant	NENBW
none	1
Hamming 0.54	1.363
Hanning 0.50	1.5
Gaussian 0.75	1.883
Kaiser 7.865	1.653
8510 6.0	1.467
Blackman	1.727
Blackman-Harris	2.021

ACLR due to Switching Transient Measurement Parameters

1. ACLR_ST_DisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
2. ACLR_ST_Start sets the start time for collecting input data.
3. ACLR_ST_Stop sets the stop time for collecting input data when ACLR_ST_Slots = 0.
4. ACLR_ST_Slots (when > 0) sets the number of slots over which data will be collected.

Depending on the values of ACLR_ST_Start, ACLR_ST_Stop, and ACLR_ST_Slots, the stop time may be adjusted.

For ACLR ST measurement for both the RF_out and Meas_in signals:

Let:
Start = TimeStep × (int(ACLR_ST_Start/TimeStep) + 0.5)
Stop = TimeStep × (int(ACLR_ST_Stop/TimeStep) + 0.5)
This means Start and Stop are forced to be an integer number of time-step intervals.

ACLR_ST_Slots	Resultant stop time
0	Stop
> 0	Start + ACLR_ST_Slots x SlotTime

For the ACLR ST of Meas_in to contain at least one complete slot, the Stop value should be set to a minimum of SlotTime + (RF DUT time delay).

For information about TimeStep and SlotTime, see Test Bench Variables for Data Displays.

OBW Measurement Parameters

The occupied bandwidth measurement is implemented by the spectrum measurement which measures the spectrum of the input signal. The occupied bandwidth is calculated by analyzing the spectrum measured in data display files.

In the following notes, TimeStep denotes the simulation time step, and FMeasurement denotes the measured RF signal characterization frequency.

1. OBW_DisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
2. The measurement outputs the complex amplitude voltage values at spectral tone frequencies.
   Spectral tone frequency power is not output; however, power, magnitude, and phase spectrums can be calculated and displayed by using the dBm, mag, and phase functions of the data display window. Note that the dBm function assumes a 50-ohm measurement reference resistance; if a different reference resistance measurement is used in the test bench, its value can be specified as a second argument to the dBm function; for example, dBm(SpecMeas, Meas_RefR) where SpecMeas is the instance name of the spectrum measurement and Meas_RefR is the resistive load used.
   By default, the displayed spectrum extends from FMeasurement - 1/(2TimeStep) Hz to FMeasurement + 1/(2TimeStep) Hz. When FMeasurement < 1/(2TimeStep), the default spectrum extends to negative frequencies. The spectral content at these negative frequencies is conjugated, mirrored, and added to the spectral content of the closest positive frequency. This way, the negative frequency tones are displayed on the positive frequency axis as would happen in an RF spectrum analyzer measurement instrument. This process may introduce an error in the displayed frequency for the mirrored tones. The absolute error introduced is less than (spectrum frequency step) / 2 (see the following table for the definition of spectrum frequency step).
   The basis of the algorithm used by the spectrum measurement is the chirp-Z transform. The algorithm can use multiple slots and average the results to achieve video averaging (see note 8).
3. OBW_Start sets the start time for collecting input data.
4. OBW_Stop sets the stop time for collecting input data when OBW_Slots = 0 and OBW_SpecMeasResBW = 0.
5. OBW_Slots (when > 0) sets the number of slots over which data will be collected.
6. OBW_SpecMeasResBW (when > 0)sets the resolution bandwidth of the spectrum measurement.
   Depending on the values of OBW_Stop, OBW_Slots, and OBW_SpecMeasResBW, the stop time may be adjusted and/or spectrum video averaging may occur. The different cases are explained in the following table.
   Let:

   Start = TimeStep × int((OBW_Start/TimeStep) + 0.5)
   Stop = TimeStep × int((OBW_Stop/TimeStep) + 0.5)
   (This means Start and Stop are forced to be an integer number of time step intervals.)
   X be the Normalized Equivalent Noise BW of the window used

   Equivalent noise bandwidth (ENBW) compares the window to an ideal, rectangular filter. It is the equivalent width of a rectangular filter that passes the same amount of white noise as the window. The normalized ENBW is the ENBW multiplied by the time duration of the signal being windowed. See Window Options and NENBW for the normalized ENBW for the different window options available.

   Effect of Different Values for OBW_Stop, OBW_Slots, and OBW_SpecMeasResBW

   Case 1	OBW_Slots = 0 OBW_SpecMeasResBW = 0 Resultant stop time = Stop Resultant resolution BW = X/(Stop - Start) Resultant spectrum frequency step = 1/(Stop-Start) Video averaging status = None
   Case 2	OBW_Slots > 0 OBW_SpecMeasResBW = 0 Resultant stop time = Start + OBW_Slots x SlotTime For OBW_Slots > 0 and OBW_SpecMeasResBW = 0 Video averaging occurs over all slot time intervals Resultant resolution BW = X/SlotTime Resultant spectrum frequency step = 1/SlotTime Video averaging status = Yes, when OBW_Slots > 1
   Case 3	OBW_Slots = 0 OBW_SpecMeasResBW > 0 Resultant stop time = Start + N*SlotTimeInterval where N = int((Stop -Start)/SlotTimeInterval) + 1 For OBW_Slots = 0 and OBW_SpecMeasResBW > 0 Define SlotTimeInterval = TimeStep * int((X/(OBW_SpecMeasResBW*TimeStep)) + 0.5) This means SlotTimeInterval is forced to a value that is an integer number of time step intervals. (Stop-Start) time is forced to be an integer number (N) of SlotTimeInterval N has a minimum value of 1 Video averaging occurs over all SlotTimeInterval The resolution bandwidth achieved is ResBW = X / SlotTimeInterval, which is very close to OBW_SpecMeasResBW but may not be exactly the same if X/(OBW_SpecMeasResBW*TimeStep) is not an exact integer. Resultant resolution BW = ResBW Resultant spectrum frequency step = ResBW Video averaging status = Yes when N > 1
   Case 4	OBW_Slots > 0 OBW_SpecMeasResBW > 0 Resultant stop time = Start + M*SlotTimeInterval where M = int((OBW_Slots x SlotTime)/SlotTimeInterval) + 1 For OBW_Slots > 0 and OBW_SpecMeasResBW > 0 Define SlotTimeInterval = TimeStep * int((X/(OBW_SpecMeasResBW*TimeStep)) + 0.5) This means SlotTimeInterval is forced to a value that is an integer number of time step intervals. (Stop-Start) time is forced to be an integer number (M) of the SlotTimeInterval M has a minimum value of 1 Video averaging occurs over all SlotTimeInterval The resolution bandwidth achieved is ResBW = X / SlotTimeInterval, which is very close to OBW_SpecMeasResBW but may not be exactly the same if X/(OBW_SpecMeasResBW*TimeStep) is not an exact integer. Resultant resolution BW = ResBW Resultant spectrum frequency step = ResBW Video averaging status = Yes, when M > 1

   The Start and Stop times are used for both the RF_out and Meas_in signal spectrum analyses. The Meas_in signal is delayed in time from the RF_out signal by the value of the RF DUT time delay. Thus for RF DUT time delay greater than zero, the RF_out and Meas_in signal are inherently different and some spectrum display difference in the two is expected.
   TimeStep and Slot_Time are defined in Test Bench Variables for Data Displays

7. OBW_SpecMeasWindow specifies the type of window. Different windows have different properties, affect the resolution bandwidth achieved, and affect spectral shape. The OBW_SpecMeasWindow is used to define the window that will be applied to each slot before its spectrum is calculated. Windowing is often necessary in transform-based (chirp-Z, FFT) spectrum estimation in order to reduce spectral distortion due to discontinuous or non-harmonic signal over the measurement time interval. Without windowing, the estimated spectrum may suffer from spectral leakage that can cause misleading measurements or masking of weak signal spectral detail by spurious artifacts.
   Window Type Definitions:
   • Hanning
     
     where W = WindowConstant
   • Hamming
     
     where W = WindowConstant
   • Blackman
     
   • Kaiser (Kaiser-Bessel)
     
     Here α = NPoints / 2, β is the shape parameter (set by WindowConstant ), and I ₀ (.) is the 0 th order modified Bessel function of the first kind.
   • Gaussian (Weierstrass)
     
     where α = WindowConstant.

     Window Options and NENBW

     Window and Default Constant	Normalized Equivalent Noise BW (X)
     None	1
     Hamming 0.54	Not defined (1 is used)
     Hanning 0.50	1.5
     Gaussian 0.75	2.215
     Kaiser 7.865	Not defined (1 is used)
     8510 6.0	Not defined (1 is used)
     Blackman	Not defined (1 is used)
     Blackman-Harris	Not defined (1 is used)

     The windowing of a signal in time has the effect of changing its power. The spectrum measurement compensates for this and the spectrum is normalized so that the power contained in it is the same as the power of the input signal.

CDP Measurement Parameters

1. CDP_DisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
2. CDP_StartSlot sets the starting slot from which slot data will be collected. The CDP_StartSlot is used for both the RF_out and Meas_in CDP analyses.

The measurement interval is one timeslot. The length of time that data will be collected is SlotTime. See Test Bench Equations Derived from Test Bench Parameters and Exported to the Data Display.

PCDE Measurement Parameters

1. PCDE_DisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
2. PCDE_StartSlot sets the starting slot from which slot data will be collected. PCDE_StartSlot is used for both RF_out and Meas_in PCDE analyses.

The measurement interval is one timeslot. The length of time that data will be collected is SlotTime. See Test Bench Equations Derived from Test Bench Parameters and Exported to the Data Display.

EVM Parameters

1. EVM_DisplayPages provides Data Display page information for this measurement. It cannot be changed by the user.
2. EVM_Start specifies starting time instant for the measurement. EVM_Start time is used for RF_out and Meas_in EVM analyses. The Meas_in signal is delayed in time from the RF_out signal by the RF DUT time delay value. Thus for RF DUT time delay >0, RF_out and Meas_in signals are inherently different and some EVM difference in the two is expected even if the RF DUT does not introduce any distortion other than time delay.
3. EVM_SlotsMeasured specifies the measurement interval. The time length of data to be collected is EVM_SlotMeasured× SlotTime. See Test Bench Equations Derived from Test Bench Parameters and Exported to the Data Display.

Signal to ESG Parameters

The EVM measurement collects data from the Meas_in signal and downloads it to an Agilent E4438C Vector Signal Generator. This measurement uses Connection Manager architecture to communicate with the instrument; parameters specify how data is interpreted.

Prerequisites for using the Signal to ESG option are:

• ESG Vector Signal Generator E4438C; for information, visit the web site http://www.agilent.com/find/esg.
• PC workstation running an instance of the connection manager server.
• Supported method of connecting the instrument to your computer through the Connection Manager architecture; for information, see Connection Manager.

Parameter Information

1. EnableESG specifies if the signal is downloaded to the ESG instrument. If set to NO, no attempt will be made to communicate with the instrument.
2. ESG_Instrument specifies a triplet that identifies the VSA resource of the instrument to be used in the simulation, the connection manager server hostname (defaults to localhost ), and the port at which the connection manager server listens for incoming requests (defaults to 4790). To ensure that this field is populated correctly, click Select Instrument, enter the server hostname and port, click OK to see the Remote Instrument Explorer dialog, select a VSA resource identifier, and click OK. For details about selecting instruments, see Instrument Discovery in the Wireless Test Bench Simulation documentation.
3. ESG_Start and ESG_Stop (when ESG_Slots=0) specify when to start and stop data collection. The number of samples collected, ESG_Stop - ESG_Start + 1, must be in the range 60 samples to 64 Msamples, where 1 Msample = 1,048,576 samples. The ESG requires an even number of samples; the last sample will be discarded if ESG_Stop - ESG_Start + 1 is odd.
4. ESG_Slots sets the number of slots over which data will be collected. When ESG_Slots > 0, ESG_Stop is forced to ESG_Start + ESG_Slots x SlotTime (where SlotTime is 5 msec).
5. ESG_ClkRef specifies an internal or external reference for the ESG clock generator. If set to External, the ESG_ExtClkRefFreq parameter sets the frequency of this clock.
6. ESG_IQFilter specifies the cutoff frequency for the reconstruction filter that lies between the DAC output and the Dual Arbitrary Waveform Generator output inside the ESG.
7. ESG_SampleClkRate sets the sample clock rate for the DAC output.
8. ESG_FileName sets the name of the waveform inside the ESG that will hold the downloaded data.
9. The ESG driver expects data in the range {-1, 1}. ESG_AutoScaling specifies whether to scale inputs to fit this range. If set to YES, inputs are scaled to the range {-1, 1}; if set to NO, raw simulation data is downloaded to the ESG without any scaling, but data outside the range {-1, 1} is clipped to -1 or 1. If set to YES, scaling is also applied to data written to the local file (ESG_FileName setting).
10. If ESG_ArbOn is set to YES, the ESG will start generating the signal immediately after simulation data is downloaded; if set to NO, waveform generation must be turned on at the ESG front panel.
11. If ESG_RFPowOn is set to YES, the ESG will turn RF power on immediately after simulation data is downloaded. If ESG_RFPowOn is set to NO (default), RF power must be turned on at the ESG front panel.
12. ESG_EventMarkerType specifies which ESG Event markers are enabled: Event1, Event2, Both, or Neither. Event markers are used for synchronizing other instruments to the ESG. When one or both EventMarkers are enabled, Event1 and/or Event2 is set beginning from the first sample of the downloaded Arb waveform over the range of points specified by the ESG_MarkerLength parameter. This is equivalent to setting the corresponding event from the front panel of the ESG.
13. ESG_MarkerLength specifies the range of points over which the markers must be set starting from the first point of the waveform. Depending on the setting of ESG_EventMarkerType, the length of trigger Event1 or Event2 (or both) is set to a multiple of the pulsewidth that, in turn, is determined by the sample clock rate of the DAC output.

Simulation Measurement Displays

After running the simulation, results are displayed in the Data Display pages for each measurement activated.

Note Measurement results from a wireless test bench have associated names that can be used in Data Display Expressions. For more information, refer to Measurement Results for Expressions for 3GPP FDD Wireless Test Benches.

RF Envelope Measurement

The RF Envelope measurement (not defined in 3GPP specifications) shows the time envelope of the 3GPP FDD RF signal. Two kinds of signals are tested: the RF signal which does not go through the DUT, and the Meas signal which does go through the DUT and may contain a few microseconds of delay, some noise, and nonlinearity.

Measurement results are shown in the following figure. Tables at the top of the data display page show some basic measurement parameters. The waveforms show the envelopes of the RF and Meas signals. Two markers identify the start points of the stable signals. An equation for Delay is defined to calculate the difference in time domain between the two markers. The value of Delay is displayed in a table to indicate the delay caused by the DUT.

RF Envelope Measurement Results

Power Measurement

The power measurement measures the CCDF (complementary cumulative distribution function) curves of the transmitter (CCDF is not defined in 3GPP specifications). The CCDF and the peak-to-average ratio is calculated for the 3GPP FDD RF signal.

Two kinds of signals are tested: the RF signal which does not go through the DUT; and, the Meas signal which does go through the DUT and may contain a few microseconds of delay, some noise, and nonlinearity.

The data display contains three pages. The following figure shows peak power, mean power and peak-to-mean ratio of RF and Meas signals.

RF and Meas Signal Power Ratios

The following figure shows two CCDF curves of RF and Meas signals. The 3GPPFDD_UE_TX_Power Equations page includes two equations that are defined to calculate peak-to-mean ratio of the RF and Meas signals.

CCDF Curves

ACLR Measurement

This measurement is used to test adjacent channel leakage power ratio (ACLR) defined in 3GPP TS 25.101, section 6.6.2.2.

ACLR is the ratio of the RRC filtered mean power centered on the assigned channel frequency to the RRC filtered mean power centered on an adjacent channel frequency. Two kinds of signals are tested: the RF signal which does not go through the DUT; and, the Meas signal which does go through DUT and may contain a few of microseconds of delay, some noise and nonlinearity.

In the data display, measurement results are automatically compared with pass/fail criteria defined in 3GPP TS 25.101, table 6.11. The comparison results are displayed on the 3GPPFDD_UE_TX_ACLR Table page (the following figure).

The data display contains three pages. The 3GPPFDD_UE_TX_ACLR Table page (the following figure) shows adjacent channel power and adjacent power ratio of the RF and Meas signals.

ACLR Measurement Results

The 3GPPFDD_UE_TX_ACLR Figures page (the following figure) shows the spectrum of the main channel and adjacent channels of the RF and Meas signals. The 3GPPFDD_UE_TX_ACLR Equations page includes several equations that are defined to calculate adjacent channel power and adjacent channel power ratio of the RF and Meas signals.

ACLR Spectrums

ACLR Due to Switching Transient Measurement

This ACLR_ST measurement is used to test adjacent channel leakage power ratio (ACLR) in the presence of switching transients, defined in 3GPP TS 25.101, section 6.6.2.2, Note 1.

ACLR is the ratio of the RRC filtered mean power centered on the assigned channel frequency to the RRC filtered mean power centered on an adjacent channel frequency. Two kinds of signal are tested: the RF signal which does not go through the DUT; and, the Meas signal which does go through the DUT and may contain a few microseconds of delay, some noise, and nonlinearity.

In the data display, the measurement results are automatically compared with pass/fail criteria defined in 3GPP TS 25.101, table 6.11, and the comparison results are displayed on the 3GPPFDD_UE_TX_ACLR_ST Table page (the following figure).

The data display contains two pages. The 3GPPFDD_UE_TX_ACLR_ST Table page (the following figure) shows adjacent channel power and adjacent power ratio of the RF and Meas signals. The 3GPPFDD_UE_TX_ACLR_ST Equations page includes several equations that are defined to calculate adjacent channel power and adjacent channel power ratio of the RF and Meas signals.

ACLR_ST Measurement Results

Occupied Bandwidth Measurement

The occupied bandwidth (OBW) measurement is defined in 3GPP TS 25.104, section 6.6.1. OBW is a measure of the bandwidth containing 99% of the total integrated power for transmitted spectrum and is centered on the assigned channel frequency. The occupied channel bandwidth must be less than 5 MHz based on a chip rate of 3.84 Mcps.

Two kinds of signals are tested: the RF signal which does not go through the DUT; and, the Meas signal which does go through the DUT and may contain a few microseconds of delay, some noise, and nonlinearity.

In the data display, measurement results are automatically compared with pass/fail criteria defined in 3GPP TS 25.101, section 6.6.1, and the comparison results are displayed on 3GPPFDD_UE_TX_OBW Table page (the following figure).

At the top of each page, an identical table contains basic measurement parameters. The 3GPPFDD_UE_TX_OBW Table page (the following figure) shows the resolution bandwidth and the occupied bandwidth of the RF and Meas signals. Adjust the markers using the keyboard arrow keys until the Lower Side and the Higher Side power ratio equals 0.5%. The 3GPPFDD_UE_TX_OBW Table page (the following figure) shows the equations used to calculate the occupied bandwidth, and the criteria used to determine if the results pass or not.

Occupied Bandwidth Measurement Results

The 3GPPFDD_UE_TX_OBW Figures page (the following figure) shows the spectrum of the RF and Meas signals with two markers placed on each spectrum.

Occupied Bandwidth Signal Spectrums

CDP Measurement

Code domain power (CDP) is a measure of power distribution on code domain (not defined in the 3GPP specifications).

The CDP is calculated by projecting the power onto the code domain at a specified spread factor (256). The CDP for every code in the domain is defined as the ratio of the mean power of the projection onto that code, to the mean power of the composite reference waveform. The measurement interval is one timeslot. Two kinds of signals are tested: the RF signal which does not go through the DUT, and the Meas signal which does go through the DUT and may contain a few microseconds of delay, some noise, and nonlinearity.

Results are shown in the following figure.

CDP Measurement Results

PCDE Measurement

This measurement is used to test peak code domain error (PCDE) defined in 3GPP TS 25.101, section 6.8.3.

PCDE is calculated by projecting the power of the error vector onto the code domain at a specified spread factor. The code domain error for every code in the domain is defined as the ratio of the mean power of the projection onto that code, to the mean power of the composite reference waveform. This ratio is expressed in dB. The PCDE is defined as the maximum value for the code domain error for all codes. The measurement interval is one timeslot. Two kinds of signals are tested: the RF signal which does not go through the DUT, and the Meas signal which does go through the DUT and may contain a few microseconds of delay, some noise and nonlinearity.

In the data display, the measurement results are compared automatically with pass/fail criteria defined in 3GPP TS 25.101, section 6.8.3.1. Comparison results are displayed on the 3GPPFDD_UE_TX_PCDE Table page (the following figure).

The data display contains three pages. The 3GPPFDD_UE_TX_PCDE Table page (the following figure) shows the peak code domain error of the RF and Meas signals.

PCDE Measurement Results

The 3GPPFDD_UE_TX_PCDE Figures page (the following figure) shows the code domain error of the RF and Meas signals; markers indicate the peak values. The 3GPPFDD_UE_TX_PCDE Equations page shows the equations used to calculate peak code domain error, and the criteria used to determine if the results pass or not.

PCDE Waveforms

EVM Measurement

This measurement is used to test error vector magnitude (EVM) defined in 3GPP TS 25.101, section 6.8.2.

EVM is a measure of the difference between the theoretical waveform and a modified version of the measured waveform. This difference is called the error vector. The measured waveform is modified by first passing it through a matched Root Raised Cosine filter with a bandwidth of 3.84MHz and 0.22 roll-off. The waveform is then further modified by selecting the frequency, absolute phase, absolute amplitude, and chip clock timing so as to minimize the error vector. The EVM result is defined as the root of the mean error vector power though the mean reference signal power expressed as a percent. The EVM cannot exceed 17.5%.

The data display contains two pages. At the top of each page, an identical table contains some basic measurement parameters. The 3GPPFDD_UE_TX_EVM Table page (the following figure) shows the EVM of the RF and Meas signals. The 3GPPFDD_UE_TX_EVM Equations page shows the criteria used to determine if the results pass or not.

EVM Measurement Results

Test Bench Variables for Data Displays

The following tables identify the reference variables used to set up this test bench:

Test Bench Constants Used to Set up 3GPP FDD User Equipment Signal

Constant	Value
SamplesPerChip	8
ChipRate	3.84 MHz
ChipsPerSlot	2560
SlotsPerFrame	15

Test Bench Equations Derived from Test Bench Parameters and Exported to the Data Display

Data Display Parameter	Equation with Test Bench Parameters
RF_FSource	FSource
RF_Power_dBm	10*log10(SourcePower)+30
RF_R	SourceR
TimeStep	1/(ChipRate*SamplesPerChip) This is the test bench simulation time step
SlotTime	ChipsPerSlot*SamplesPerChip*TimeStep This is the time duration of each slot
FrameTime	SlotTime*SlotsPerFrame
Meas_FMeasurement	FMeasurement
Meas_R	MeasR

Baseline Performance

• Test Computer Configuration
  • Pentium IV 2.4 GHz, 512 MB RAM, Red Hat Linux 7.3
• Conditions
  • Measurements made with default test bench settings.
  • RF DUT is an RF system behavior component.
  • The number of time points in one slot can be calculated by SamplesPerChip times ChipsPerSlot.
    ChipRate = 3.84 MHz
    SamplesPerChip = 8
    ChipsPerSlot = 2560
    Resultant WTB_TimeStep = 32.6 nsec; SlotTime = 666.7 µ time points per slot = 20480
• Simulation times and memory requirements

  3GPPFDD_UE_TX Measurement	Slots Measured	Simulation Time (sec)	ADS Processes (MB)
  RF_Envelope	1	9	207
  Power	1	7	205
  ACLR	1	91	205
  ACLR_ST	1	47	209
  Occupied BW	1	9	212
  CDP	1	101	211
  PCDE	1	436	212
  EVM	1	434	205

Expected ADS Performance

Expected ADS performance is the combined performance of the baseline test bench and the RF DUT Circuit Envelope simulation with the same signal and number of time points. For example, if the RF DUT performance with Circuit Envelope simulation alone takes 2 hours and consumes 200 MB of memory (excluding the memory consumed by the core ADS product), then add these numbers to the Baseline Performance numbers to determine the expected ADS performance. This is valid only if the full memory consumed is from RAM. If RAM is less, larger simulation times may result due to increased disk access time for swap memory usage.

References

3GPPFDD_UE_TX Test Bench specific references:

1. 3GPP Technical Specification TS 25.211, "Physical channels and mapping of transport channels onto physical channels (FDD)" Release 1999.
   http://www.3gpp.org/ftp/Specs/2002-03/R1999/25_series/25211-3a0.zip
2. 3GPP Technical Specification TS 25.212, "Multiplexing and Channel Coding (FDD)" Release 1999.
   http://www.3gpp.org/ftp/Specs/2002-03/R1999/25_series/25212-390.zip
3. 3GPP Technical Specification TS 25.213, "Spreading and modulation (FDD)" Release 1999.
   http://www.3gpp.org/ftp/Specs/2002-03/R1999/25_series/25213-370.zip
4. 3GPP Technical Specification TS 25.101, "UE Radio transmission and reception (FDD)" Release 1999.
   http://www.3gpp.org/ftp/Specs/2002-03/R1999/25_series/25101-3a0.zip
5. 3GPP Technical Specification TS 34.121, "Terminal Conformance Specification, Radio Transmission and Reception (FDD)" Release 1999.
   http://www.3gpp.org/ftp/Specs/2002-03/R1999/34_series/34121-380.zip

Setting up a Wireless Test Bench Analysis in the Wireless Test Bench Simulation documentation explains how to use test bench windows and dialogs to perform analysis tasks.

Setting Circuit Envelope Analysis Parameters in the Wireless Test Bench Simulation documentation explains how to set up circuit envelope analysis parameters such as convergence criteria, solver selection, and initial guess.

Setting Automatic Behavioral Modeling Parameters in the Wireless Test Bench Simulation documentation to learn how to improve simulation speed.