3GPP FDD User Equipment Receiver Test

3GPPFDD_UE_RX is the test bench for 3GPP FDD user equipment receiver testing. The test bench provides a way for users to connect to an RF circuit device under test and determine its performance using pre-defined test bench measurements. This test bench provides signal measurements for reference sensitivity level, maximum input level, adjacent channel selectivity, and blocking and intermodulation characteristics.

The signal and the measurements are designed according to 3GPP Technical Specifications TS 25.101 and TS 34.121. Versions supported are 2000-03, 2000-12, and 2002-03.

This 3GPP FDD signal model is compatible with Agilent E4438C ESG Vector Signal Generator, Option 400 (3GPP W-CDMA Firmware Option for the E4438C ESG Vector Signal Generator). Details regarding Agilent E4438C ESG are included at the website http://www.agilent.com/find/esg.

This test bench includes a TX DSP section, an RF modulator, RF output source resistance, an RF DUT connection, RF receivers, and DSP measurement blocks as illustrated in the following figure. The generated test signal is sent to the DUT.

Receiver Wireless Test Bench Block Diagram

The 3GPPFDD_UE_RX test bench uses the downlink 12.2kbps reference measurement channel. One 12.2kbps DTCH (dedicated transport channel) and one 2.4kbps DCCH (dedicated control channel) are multiplexed into one 60kbps DPCH (dedicated physical data channel). The signal source includes one DPCH, one PCCPCH (primary common control physical channel), one PSCH (primary synchronization channel), one SSCH (secondary synchronization channel), one CPICH (common pilot channel), and one PICH (page indication channel).

In user equipment receiver measurements except maximum input level, channels are set according to the following table.

Downlink Physical Channels Transmitted During a Connection

Physical Channel	Power
P-CPICH	P-CPICH_Ec / DPCH_Ec = 7dB
P-CCPCH	P-CCPCH_Ec / DPCH_Ec = 5dB
SCH	SCH_Ec / DPCH_Ec = 5dB
PICH	PICH_Ec / DPCH_Ec = 2dB
DPCH	Test dependent power

SCH power is divided equally between primary and secondary synchronous channels, so the P-SCH_Ec/(DPCH_Ec = S-SCH_Ec*DPCH_Ec) = 2dB.

For the maximum input level measurement, the OCNS interference is set to the power necessary to achieve the required DPCH_Ec/I _or of -19dB. The gain of the other channels remain the same.

All measurements provide BER results for DCCH and DTCH.

Test Bench Basics

A template is provided for this test bench.

3GPPFDD User Equipment Receiver Test Bench

To access the template:

1. In an Analog/RF schematic window select Insert > Template.
2. In the Insert > Template dialog box, choose 3GPPFDD_UE_RX_test, click OK; click left to place the template in the schematic window.

An example design using this template is available; from the ADS Main window click File > Example Project > WCDMA3G_RF_Verification_prj > 3GPPFDD_UE_RX_test .dsn.

The basics for using the test bench are:

• Connect to an RF DUT that is suitable for this test bench.
• CE_TimeStep, FSource, SourcePower, and FMeasurement parameter default values are typically accepted; if not, set values based on your requirements.
• Activate/deactivate measurement(s) based on your requirements.
• Run the simulation and view Data Display page(s) for your measurement(s).

For details, refer to Test Bench Details.

Test Bench Details

The following sections provide details for setting up a test bench, setting measurement parameters for more control of the test bench, simulation measurement displays, and baseline performance.

Open and use the template:

1. In an Analog/RF schematic window select Insert > Template.
2. In the Insert > Template dialog box, choose 3GPPFDD_UE_RX_test, click OK; click left to place the template in the schematic window.

The test bench setup is detailed here.

1. Replace the DUT (Amplifier2 is provided with this template) with an RF DUT that is suitable for this test bench.
   For general information regarding using certain types of DUTs, see Appendix A, RF DUT Limitations.
2. Set the Required Parameters.

   Note Refer to 3GPPFDD_UE_RX for a complete list of parameters for this test bench.

   Generally, default values can be accepted; otherwise, values can be changed by the user as needed.

   • Set CE_TimeStep.
     Cosimulation occurs between the test bench (using Agilent Ptolemy Data Flow simulation technology) and the DUT (using Agilent Circuit Envelope simulation technology). Each technology requires its own simulation time step with time-step coordination occurring in the interface between the technologies.
     CE_TimeStep defines the Circuit Envelope simulation time step to be used with this DUT. The CE_TimeStep must be set to a value equal to or a submultiple of (less than) WTB_TimeStep; otherwise, simulation will stop and an error message will be displayed.
     The CE_TimeStep value is exported to the Choosing Analyses window in the Circuit Envelope Time Step field when the user clicks OK in the Wireless Test Bench Setup window.
     Note that WTB_TimeStep is not user-settable. Its value is derived from other test bench parameter values; with default settings WTB_TimeStep=1/(3.84e6 × 8) sec. The value is displayed in the Data Display pages as TimeStep.

     WTB_TimeStep = 1/(ChipRate × SamplesPerChip)

     where

     ChipRate is the non-settable value (3.84 MHz)
     SamplesPerChip is the number of waveform sampling points during pulse forming.

   • Set FSource, SourcePower, and FMeasurement.
     • FSource defines the RF frequency for the signal input to the RF DUT.
     • SourcePower defines the power level for FSource. SourcePower is defined as the average power during the non-idle time of the signal.
     • FMeasurement defines the RF frequency output from the DUT to be measured.
   • MeasType specifies the type of measurement.
     Pre-defined measurement settings (according to 3GPP specifications) are provided for Ior_Power, DPCH_Ec_2_Ior, CW interference, and modulated interference.
3. Activate/deactivate ( YES / NO ) test bench measurements (refer to 3GPPFDD_UE_RX). At least one measurement must be enabled.
4. More control of the test bench can be achieved by setting Basic Parameters, Signal Parameters, and parameters for each measurement. For details refer to Parameter Settings.
5. The RF modulator (shown in the block diagram in Receiver Wireless Test Bench Block Diagram) uses FSource, SourcePower ( Required Parameters ), MirrorSourceSpectrum ( Basic Parameters), GainImbalance, PhaseImbalance, I OriginOffset, Q OriginOffset, and IQ Rotation ( Signal Parameters ).
   The RF output resistance uses SourceR, SourceTemp, and EnableSourceNoise ( Basic Parameters ). The RF output signal source has a 50-ohm (default) output resistance defined by SourceR.
   RF output (and input to the RF DUT) is at the frequency specified (FSource), with the specified source resistance (SourceR) and with power (SourcePower) delivered into a matched load of resistance SourceR. The RF signal has additive Gaussian noise power set by resistor temperature (SourceTemp) (when EnableSourceNoise=YES).
   Note that the Meas_in point of the test bench provides a resistive load to the RF DUT set by the MeasR value (50 Ω default) ( Basic Parameters ).
   The Meas signal contains linear and nonlinear signal distortions and time delays associated with the RF DUT input to output characteristics.
   The TX DSP block (shown in the block diagram in Receiver Wireless Test Bench Block Diagram) uses other Signal Parameters.
6. More control of the Circuit Envelope simulation of the RF DUT is achieved by selecting Options in the Choosing Analysis window. These advanced options include enabling Automatic Behavioral Modeling (which may speed up the RF DUT simulation by over 10X), and setting Circuit Envelope parameters. Setting these simulations options is described in Setting Automatic Behavioral Modeling Parameters and Setting Circuit Envelope Analysis Parameters in the Wireless Test Bench Simulation documentation.
7. To run a simulation, choose Simulation > Run in the Analog Design Environment main window.
   For details, refer to R unning a Simulation in the Wireless Test Bench Simulation documentation.
8. Simulation results will appear in a Data Display window for each measurement. Simulation Measurement Displays describes results for each measurement available for this test bench.
   For details on Viewing Results refer to the Wireless Test Bench Simulation documentation.