HSUPA User Equipment Transmitter Test
Introduction
The HSUPA_RF_Verification_prj project shows how to build an application that can be used as a Wireless Test Bench (WTB) and includes a special Summary data display page.
There is only one schematic design, HSUPA_UE_TX_test.dsn, under the HSUPA_RF_Verification_prj. Currently, this design covers four basic 3GPP/HSUPA user equipment transmitter measurements. They are:
- Maximum power measurements
- Adjacent channel leakage power ratio (ACLR) measurements
- Peak code domain error (PCDE) measurements
- Error vector magnitude (EVM) measurements
The DUT output signal can be sent to an Agilent ESG RF signal generator.
Test Bench Basics
The test bench schematic is shown in HSUPA_UE_TX.dsn Schematic.

HSUPA_UE_TX.dsn Schematic
HSUPA_UE_TX_test.dsn provides these features:
- WTB style
- subnetwork model HSUPA_UE_TX including both signal source and measurements
- various measurements
- analog/RF design schematic
- Envelope/WTB co-simulation
- Agilent ESG RF signal generator connectivity
This design measures four user equipment transmitter characteristics (Maximum Power, ACLR, PCDE, and EVM). By turning on/off certain measurements, any combination of said four measurements can be completed in just one simulation.
Test Bench Details
HSUPA_UE_TX is used to generate an RF uplink signal and complete the measurements; the schematic for this subnetwork model is shown in HSUPA_UE_TX Schematic; parameters are listed in Parameter Table of HSUPA_UE_TX.

HSUPA_UE_TX Schematic
HSUPA_UE_TX
This section provides parameter information for Required Parameters , Basic Parameters , Signal Parameters , and parameters for the various measurements.

Description HSUPA user equipment TX test
Library
Class
Derived From
Parameters
| Name | Description | Default | Type | Unit | Range |
|---|---|---|---|---|---|
| Required Parameters | |||||
| CE_TimeStep | Circuit envelope simulation time step | 1/3.84 MHz/8 | real | sec | (0:inf) |
| WTB_TimeStep | Set CE_TimeStep <= 1/3.84e6/SamplesPerChip. SamplesPerChip is in Signal Parameters tab/category. |
||||
| FSource | Source carrier frequency | 1950 MHz | real | Hz | (0:inf) |
| SourcePowerClass | Source power class: Class 3, Class 4 | Class 3 | enum | ||
| FMeasurement | Measurement carrier frequency | 1950 MHz | real | Hz | (0:inf) |
| MeasurementInfo | Available Measurements Each measurement has parameters on its tab/category below. |
||||
| PowerMeasurement | Enable power measurement?: NO, YES | YES | enum | ||
| ACLR_Measurement | Enable ACLR measurement?: NO, YES | NO | enum | ||
| PCDE_Measurement | Enable peak code domain error measurement?: NO, YES | NO | enum | ||
| EVM_Measurement | Enable EVM measurement?: NO, YES | NO | enum | ||
| Basic Parameters | |||||
| SourceR | Source resistance | 50 Ohm | real | Ohm | (0:inf) |
| SourceTemp | Source resistor temperature | -273.15 | real | Celsius | [-273.15:inf) |
| EnableSourceNoise | Enable source thermal noise?: NO, YES | NO | enum | ||
| MeasR | Measurement resistance | 50 Ohm | real | Ohm | [10:1.0e6] |
| MirrorSourceSpectrum | Mirror source spectrum about carrier?: NO, YES | NO | enum | ||
| MirrorMeasSpectrum | Mirror meas spectrum about carrier?: NO, YES | NO | enum | ||
| RF_MirrorFreq | Mirror source frequency for spectrum/envelope measurement?: NO, YES | NO | enum | ||
| MeasMirrorFreq | Mirror meas frequency for spectrum/envelope measurement?: NO, YES | NO | enum | ||
| DUT_DelayBound | DUT delay bound | 10.0 usec | real | sec | [0:(400.0/3840000)] |
| TestBenchSeed | Random number generator seed | 1234567 | int | [0:inf) | |
| Signal Parameters | |||||
| GainImbalance | Gain imbalance, Q vs I | 0.0 | real | dB | (-inf:inf) |
| PhaseImbalance | Phase imbalance, Q vs I | 0.0 | real | deg | (-inf:inf) |
| I_OriginOffset | I origin offset (percent) | 0.0 | real | (-inf:inf) | |
| Q_OriginOffset | Q origin offset (percent) | 0.0 | real | (-inf:inf) | |
| IQ_Rotation | IQ rotation | 0.0 | real | deg | (-inf:inf) |
| SamplesPerChip | Samples per chip | 8 | int | [2:32] | |
| RRC_FilterLength | RRC filter length (chips) | 16 | int | [2:128] | |
| Power Measurement Parameters | |||||
| PowerDisplayPages | Power measurement display pages: 3GPPFDD_UE_TX_Power Equations 3GPPFDD_UE_TX_Power Table 3GPPFDD_UE_TX_Power Figures |
||||
| PowerStartSlot | Start slot | 0 | int | [0:inf) | |
| PowerSlotsMeasured | Slots measured | 5 | int | [0:inf) | |
| ACLR_Measurement Parameters | |||||
| ACLR_DisplayPages | ACLR measurement display pages: 3GPPFDD_UE_TX_ACLR Equations 3GPPFDD_UE_TX_ACLR Table 3GPPFDD_UE_TX_ACLR Figures |
||||
| ACLR_Start | Measurement start | 0.0 | real | sec | [0:inf) |
| ACLR_Stop | Measurement stop | (2560/3.84) usec | real | sec | (0:inf) |
| ACLR_Slots | Measurement slots | 0 | int | [0:100] | |
| ACLR_SpecMeasResBW | Spectrum resolution bandwidth | 0 | real | Hz | [0:inf) |
| ACLR_SpecMeasWindow | Window type: ACLR_none, ACLR_Hamming 0.54, ACLR_Hanning 0.50, ACLR_Gaussian 0.75, ACLR_Kaiser 7.865, ACLR_8510 6.0, ACLR_Blackman, ACLR_Blackman-Harris | ACLR_none | enum | ||
| PCDE_Measurement Parameters | |||||
| PCDE_DisplayPages | PCDE measurement display pages: 3GPPFDD_UE_TX_PCDE Equations 3GPPFDD_UE_TX_PCDE Table 3GPPFDD_UE_TX_PCDE Figures |
||||
| PCDE_StartSlot | Start slot | 0 | int | [0:inf) | |
| EVM_Measurement Parameters | |||||
| EVM_DisplayPages | EVM measurement display pages: 3GPPFDD_UE_TX_EVM Equations 3GPPFDD_UE_TX_EVM Table |
||||
| EVM_Start | Measurement start | 0.0 | real | sec | [0:inf) |
| EVM_SlotsMeasured | Slots to measure | 1 | int | [0:inf) | |
| EVM_ExcludeTransition | select YES for predictable power changes: NO, YES | NO | enum | ||
| SignalToESG_Parameters | |||||
| EnableESG | Enable signal to ESG?: NO, YES | NO | enum | ||
| ESG_Instrument | ESG instrument address | [GPIB0::19::INSTR][4790] | instrument | ||
| ESG_Start | Signal start | 0.0 | real | sec | [0:inf) |
| ESG_Stop | Signal stop | (2560/3.84) usec | real | sec | [(ESG_Start+60/3.84e6/S):(ESG_Start+32/3.84/S)] |
| ESG_Slots | Slots to ESG | 15 | int | [0:1000] | |
| ESG_Power | ESG RF output power (dBm) | -20.0 | real | (-inf:inf) | |
| ESG_ClkRef | Waveform clock reference: Internal, External | Internal | enum | ||
| ESG_ExtClkRefFreq | External clock reference freq | 10 MHz | real | Hz | (0:inf) |
| ESG_IQFilter | IQ filter: through, filter_2100kHz, filter_40MHz | through | enum | ||
| ESG_SampleClkRate | Sequencer sample clock rate | 30.72 MHz | real | Hz | (0:inf) |
| ESG_Filename | ESG waveform storage filename | HSUPA_UL | string | ||
| ESG_AutoScaling | Activate auto scaling?: NO, YES | YES | enum | ||
| ESG_ArbOn | Select waveform and turn ArbOn after download?: NO, YES | YES | enum | ||
| ESG_RFPowOn | Turn RF ON after download?: NO, YES | YES | enum | ||
| ESG_EventMarkerType | Event marker type: Neither, Event1, Event2, Both | Event1 | enum | ||
| ESG_MarkerLength | ESG marker length | 10 | int | [1:60] | |
Simulation Measurement Displays
After running the simulation, results are automatically displayed in data display pages. The measurement data display templates corresponding to the selected measurements will also appear in the data display window.
This test bench also provides a Results Summary data display template that will appear in the data display window similar to the example shown in User Equipment Transmitter Test Bench - Summary.

User Equipment Transmitter Test Bench - Summary
The summary display page gives a Passed / Failed overview of the test results. For a deactivated measurement, N/A will be displayed.
Detailed measurement results pages can be accessed using the data display window's Page menu or toolbar button.
Baseline Performance
Reference simulation time, measured on a Pentium III/866M 384M PC running ADS 2005A on Microsoft Windows 2000:
- about 1.5 minutes for maximum output power measurement
- about 2 minutes for ACLR measurement
- about 2 minutes for PCDE measurement
- about 2 minutes for EVM measurement
References
- 3GPP Technical Specification TS 25.101, "UE Radio transmission and Reception (FDD)," Version 6.11.0, Mar. 2006.
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