Linear Analysis Using Group Delay and Noise Figure as Measurements

Description

This simulation setup performs a yield analysis using the amplifier's group delay and noise figure as measurements. When the simulation is complete the estimated yield is given, and the data is ready to be analyzed using the appropriate data displays.

Needed to Use Schematic

An amplifier schematic using linear or nonlinear models must be inserted into the schematic. A sample schematic, Sample_Stat_PA, is initially present, inserted into the simulation schematic.

Main Schematic Settings

• Follow all the numbered steps in the upper left-hand box on this statistical analysis schematic
• Using the same parameters you initially used with the Power Amplifier DesignGuide, set the frequency sweep range

Data Display Options

There are 5 data displays associated with this schematic:

• One YSH with Group Delay and Noise Figure as the Measurements (YSH_GrpDly_NF_One.dds)
• The parameter to be graphed, Var1, can be changed and the YSH will be immediately updated
  • The yield specifications can be changed and the YSH will be immediately updated
  • The frequency range over which the yield specifications are applied can be changed and the YSH will be immediately updated
  • The overall yield, as well as the yield for group delay and noise figure are displayed
  • The number of amplifiers showing unconditional stability is displayed
• Four YSH's with Group Delay and Noise Figure as the Measurements (YSH_GrpDly_NF_Four.dds)
  • All the same features as above except there are four YSH's plotted, with one assignable circuit parameter for each YSH
• One MH with Group Delay and Noise Figure as the Measurements (MH_GrpDly_NF_One.dds)
  • The measurement that can be graphed is group delay or noise figure. This can be changed and the graph is immediately updated
  • The number of pass, number of fail and overall yield are given
  • The two graphs are identical except for their vertical axes, one being percent and the other being the actual number of occurrences
• Two MH's with Group Delay and Noise Figure as the Measurements (MH_GrpDly_NF_Two.dds)
  • The same features as above except that two MH's are graphed, using group delay and noise figure as the measurement
  • The vertical axis on each graph is number of occurrences
• SRP with Group Delay and Noise Figure as the Measurements (SRP_GrpDly_NF.dds)
  • SRP's for group delay and noise figure are given
  • Sigma plots of group delay and noise figure are given
  • For group delay and noise figure, a table of the mean, the mean plus one standard deviation and the mean minus one standard deviation for each measurement frequency is given
    where YSH is Yield Sensitivity Histogram, MH is Measurement Histogram and SRP is Statistical Response Plot.

Schematic Name

YAS_GrpDly_NF
where YAS is Yield Analysis Schematic.

Data Display Names

YSH_GrpDly_NF_One.dds
YSH_GrpDly_NF_Four.dds
MH_GrpDly_NF_One.dds
MH_GrpDly_NF_Four.dds
SRP_GrpDly_NF.dds