Linear Analysis Using S-Parameters as Measurements

Description

This simulation setup performs a yield analysis using the amplifier's small signal S-parameters as measurements. Specifically S11, S22 and S21 are used. When the simulation is complete the estimated yield is given, and the data is ready to be analyzed using the appropriate data displays.

Needed to Use Schematic

An amplifier schematic using linear or nonlinear models must be inserted into the schematic. A sample schematic, Sample_Stat_PA, is initially present, inserted into the simulation schematic.

Main Schematic Settings

• Follow all the numbered steps in the upper left-hand box on this statistical analysis schematic
• Using the same parameters you initially used with the Amplifier DesignGuide, set the frequency sweep range

  Note This is the simplest analysis schematic, and it is a good one to start out with.

Data Display Outputs

There are 5 data displays associated with this schematic:

• One YSH with S-Parameters as the Measurements (YSH_SParams_One.dds)
  • The S-Parameters included are S11, S21, and S22
  • The parameter to be graphed, Var1, can be changed and the YSH will be immediately updated
  • The yield specifications can be changed and the YSH will be immediately updated
  • The frequency range over which the yield specifications are applied can be changed and the YSH will be immediately updated
  • The overall yield, as well as the yield for S11, S22 and S21 are displayed
  • The number of amplifiers showing unconditional stability is displayed
• Four YSH's with S-Parameters as the Measurements (YSH_SParams_Four.dds)
  • All the same features as above except there are four YSH's plotted, with one assignable circuit parameter for each YSH
• One MH with S-Parameters as the Measurements (MH_SParams_One.dds)
  • The measurement that can be graphed is S11, S21, or S22. This can be changed and the graph is immediately updated
  • The number of pass, number of fail and overall yield are given
  • The two graphs are identical except for their vertical axes, one being percent and the other being the actual number of occurrences
• Four MH's with S-Parameters as the Measurements (MH_SParams_Four.dds)
  • The same features as above except that four MH's are graphed, using S11, S21, S22 and S12 as the measurements
  • The vertical axis on each graph is the number of occurrences
• SRP with S-Parameters as the Measurements (SRP_SParams.dds)
  • SRP's for S11, S22 and S21 are given
  • Sigma plots of S11, S22 and S21 are given
  • For each S-Parameter, a table of the mean, the mean plus one standard deviation and the mean minus one standard deviation for each measurement frequency is given
    where YSH is Yield Sensitivity Histogram, MH is Measurement Histogram and SRP is Statistical Response Plot.

Schematic Name

YAS_SParams
where YAS is Yield Analysis Schematic

Data Display Names

YSH_SParams_One.dds
YSH_SParams_Four.dds
MH_SParams_One.dds
MH_SParams_Four.dds
SRP_SParams.dds